Skip to main content

Medical Subject Headings (thesaurus)

Search from vocabulary

align
annotate
download

Concept information

... > Diagnosis > Diagnostic Techniques and Procedures > Diagnostic Imaging > Microscopy > Microscopy, Scanning Probe > Microscopy, Atomic Force
Investigative Techniques > Microscopy > Microscopy, Scanning Probe > Microscopy, Atomic Force
... > Natural Science Disciplines > Physics > Optics and Photonics > Microscopy > Microscopy, Scanning Probe > Microscopy, Atomic Force
... > Technology, Industry, and Agriculture > Engineering > Optics and Photonics > Microscopy > Microscopy, Scanning Probe > Microscopy, Atomic Force

Preferred term

Microscopy, Atomic Force  

Type

  • mesh:Descriptor

Definition

  • A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.

Broader concept

Related concepts

Entry terms

  • Atomic Force Microscopy
  • Force Microscopy
  • Scanning Force Microscopy

Allowable Qualifier(s)

In other languages

  • Microscopie à force atomique

    French

  • MFA (Microscopie à Force Atomique)
  • Microscopie à champ de force atomique
  • Microscopie à force
  • Microscopie à force à balayage
  • Microscopie AFM (Atomic Force Microscopy)
  • Microscopie de force
  • Microscopie de force à balayage
  • Microscopie de force atomique
  • Microscopie en force atomique
  • Microscopie par force atomique

URI

http://data.loterre.fr/ark:/67375/JVR-LFTW0NVQ-H

Download this concept:

RDF/XML TURTLE JSON-LD Created 4/16/94, last modified 7/7/04