Concept information
Preferred term
Microscopy, Scanning Probe
Type
-
mesh:Descriptor
Definition
- Scanning microscopy in which a very sharp probe is employed in close proximity to a surface, exploiting a particular surface-related property. When this property is local topography, the method is atomic force microscopy (MICROSCOPY, ATOMIC FORCE), and when it is local conductivity, the method is scanning tunneling microscopy (MICROSCOPY, SCANNING TUNNELING).
Broader concept
Narrower concepts
Entry terms
- Scanning Probe Microscopy
Allowable Qualifier(s)
In other languages
-
French
-
Microscopie à balayage de sonde
URI
http://data.loterre.fr/ark:/67375/JVR-PC1MTM67-9
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