Concept information
Preferred term
Spectrometry, Mass, Secondary Ion
Type
-
mesh:Descriptor
Definition
- A mass-spectrometric technique that is used for microscopic chemical analysis. A beam of primary ions with an energy of 5-20 kiloelectronvolts (keV) bombards a small spot on the surface of the sample under ultra-high vacuum conditions. Positive and negative secondary ions sputtered from the surface are analyzed in a mass spectrometer in regards to their mass-to-charge ratio. Digital imaging can be generated from the secondary ion beams and their intensity can be measured. Ionic images can be correlated with images from light or other microscopy providing useful tools in the study of molecular and drug actions.
Broader concept
Entry terms
- Mass Spectrometry, Secondary Ion
- Mass Spectroscopy, Secondary Ion
- Secondary Ion Mass Spectrometry
- Secondary Ion Mass Spectrometry Microscopy
- Secondary Ion Mass Spectroscopy
- Secondary Ion Mass Spectroscopy Microscopy
- SIMS Microscopy
- Spectroscopy, Mass, Secondary Ion
Allowable Qualifier(s)
In other languages
-
French
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Microscopie par spectrométrie de masse d'ions secondaires
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Microscopie par spectroscopie de masse d'ions secondaires
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Microscopie SIMS
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Spectrométrie de masse à ionisation secondaire
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Spectrométrie de masse à ions secondaires
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Spectrométrie de masse des ions secondaires
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Spectrométrie de masse SIMS
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Spectrométrie de masse SIMS (Secondary Ion Mass Spectrometry)
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Spectroscopie de masse à ionisation secondaire
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Spectroscopie de masse à ions secondaires
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Spectroscopie de masse d'ions secondaires
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Spectroscopie de masse des ions secondaires
URI
http://data.loterre.fr/ark:/67375/JVR-RNLS930Q-2
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