Concept information
Preferred term
Electron Probe Microanalysis
Type
-
mesh:Descriptor
Definition
- Identification and measurement of ELEMENTS and their location based on the fact that X-RAYS emitted by an element excited by an electron beam have a wavelength characteristic of that element and an intensity related to its concentration. It is performed with an electron microscope fitted with an x-ray spectrometer, in scanning or transmission mode.
Broader concept
Entry terms
- Microanalysis, Electron Probe
- Microscopy, Electron, X-Ray Microanalysis
- Spectrometry, X Ray Emission, Electron Microscopic
- Spectrometry, X-Ray Emission, Electron Microscopic
- Spectrometry, X Ray Emission, Electron Probe
- Spectrometry, X-Ray Emission, Electron Probe
- X Ray Emission Spectrometry, Electron Microscopic
- X-Ray Emission Spectrometry, Electron Microscopic
- X Ray Emission Spectrometry, Electron Probe
- X-Ray Emission Spectrometry, Electron Probe
- X-Ray Microanalysis
- X-Ray Microanalysis, Electron Microscopic
- X-Ray Microanalysis, Electron Probe
Allowable Qualifier(s)
In other languages
-
French
-
Microanalyse à rayons X
-
Microanalyse aux rayons X
-
Microanalyse par rayons X
-
Microanalyse X
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Microanalyse X en microscopie électronique
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Microanalyse X par sonde électronique
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Spectrométrie d'émission X en microscopie électronique
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Spectrométrie d'émission X par sonde électronique
URI
http://data.loterre.fr/ark:/67375/JVR-V88F3ZBD-R
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