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... > Diagnosis > Diagnostic Techniques and Procedures > Diagnostic Imaging > Microscopy > Microscopy, Electron > Microscopy, Electron, Scanning
Investigative Techniques > Microscopy > Microscopy, Electron > Microscopy, Electron, Scanning
... > Natural Science Disciplines > Physics > Optics and Photonics > Microscopy > Microscopy, Electron > Microscopy, Electron, Scanning
... > Technology, Industry, and Agriculture > Engineering > Optics and Photonics > Microscopy > Microscopy, Electron > Microscopy, Electron, Scanning

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Microscopy, Electron, Scanning  

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Tipo

  • mesh:Descriptor

Definición

  • Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point. The image is constructed by detecting the products of specimen interactions that are projected above the plane of the sample, such as backscattered electrons. Although SCANNING TRANSMISSION ELECTRON MICROSCOPY also scans the specimen point by point with the electron beam, the image is constructed by detecting the electrons, or their interaction products that are transmitted through the sample plane, so that is a form of TRANSMISSION ELECTRON MICROSCOPY.

Concepto genérico

Conceptos relacionados

Etiquetas alternativas

  • Electron Scanning Microscopy
  • Scanning Electron Microscopy

En otras lenguas

URI

http://data.loterre.fr/ark:/67375/JVR-GX7DZ03J-F

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