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... > Diagnosis > Diagnostic Techniques and Procedures > Diagnostic Imaging > Microscopy > Microscopy, Scanning Probe > Microscopy, Atomic Force
Investigative Techniques > Microscopy > Microscopy, Scanning Probe > Microscopy, Atomic Force
... > Natural Science Disciplines > Physics > Optics and Photonics > Microscopy > Microscopy, Scanning Probe > Microscopy, Atomic Force
... > Technology, Industry, and Agriculture > Engineering > Optics and Photonics > Microscopy > Microscopy, Scanning Probe > Microscopy, Atomic Force

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Microscopy, Atomic Force  

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Tipo

  • mesh:Descriptor

Definición

  • A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.

Concepto genérico

Conceptos relacionados

Etiquetas alternativas

  • Atomic Force Microscopy
  • Force Microscopy
  • Scanning Force Microscopy

En otras lenguas

  • Microscopie à force atomique

    francés

  • MFA (Microscopie à Force Atomique)
  • Microscopie à champ de force atomique
  • Microscopie à force
  • Microscopie à force à balayage
  • Microscopie AFM (Atomic Force Microscopy)
  • Microscopie de force
  • Microscopie de force à balayage
  • Microscopie de force atomique
  • Microscopie en force atomique
  • Microscopie par force atomique

URI

http://data.loterre.fr/ark:/67375/JVR-LFTW0NVQ-H

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RDF/XML TURTLE JSON-LD Creado 16/4/94, última modificación 7/7/04