Concept information
Término preferido
Microscopy, Scanning Probe
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Tipo
-
mesh:Descriptor
Definición
- Scanning microscopy in which a very sharp probe is employed in close proximity to a surface, exploiting a particular surface-related property. When this property is local topography, the method is atomic force microscopy (MICROSCOPY, ATOMIC FORCE), and when it is local conductivity, the method is scanning tunneling microscopy (MICROSCOPY, SCANNING TUNNELING).
Concepto genérico
Conceptos específicos
Etiquetas alternativas
- Scanning Probe Microscopy
En otras lenguas
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francés
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Microscopie à balayage de sonde
URI
http://data.loterre.fr/ark:/67375/JVR-PC1MTM67-9
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