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Electron Probe Microanalysis  

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Tipo

  • mesh:Descriptor

Definición

  • Identification and measurement of ELEMENTS and their location based on the fact that X-RAYS emitted by an element excited by an electron beam have a wavelength characteristic of that element and an intensity related to its concentration. It is performed with an electron microscope fitted with an x-ray spectrometer, in scanning or transmission mode.

Etiquetas alternativas

  • Microanalysis, Electron Probe
  • Microscopy, Electron, X-Ray Microanalysis
  • Spectrometry, X Ray Emission, Electron Microscopic
  • Spectrometry, X Ray Emission, Electron Probe
  • Spectrometry, X-Ray Emission, Electron Microscopic
  • Spectrometry, X-Ray Emission, Electron Probe
  • X Ray Emission Spectrometry, Electron Microscopic
  • X Ray Emission Spectrometry, Electron Probe
  • X-Ray Emission Spectrometry, Electron Microscopic
  • X-Ray Emission Spectrometry, Electron Probe
  • X-Ray Microanalysis
  • X-Ray Microanalysis, Electron Microscopic
  • X-Ray Microanalysis, Electron Probe

En otras lenguas

  • francés

  • Microanalyse à rayons X
  • Microanalyse aux rayons X
  • Microanalyse par rayons X
  • Microanalyse X
  • Microanalyse X en microscopie électronique
  • Microanalyse X par sonde électronique
  • Spectrométrie d'émission X en microscopie électronique
  • Spectrométrie d'émission X par sonde électronique

URI

http://data.loterre.fr/ark:/67375/JVR-V88F3ZBD-R

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