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Concept information

Diagnosis > Diagnostic Techniques and Procedures > Diagnostic Imaging > Microscopy > Microscopy, Scanning Probe
Investigative Techniques > Microscopy > Microscopy, Scanning Probe
Natural Science Disciplines > Physics > Optics and Photonics > Microscopy > Microscopy, Scanning Probe
Technology, Industry, and Agriculture > Engineering > Optics and Photonics > Microscopy > Microscopy, Scanning Probe

Terme préférentiel

Microscopy, Scanning Probe  

Type

  • mesh:Descriptor

Définition

  • Scanning microscopy in which a very sharp probe is employed in close proximity to a surface, exploiting a particular surface-related property. When this property is local topography, the method is atomic force microscopy (MICROSCOPY, ATOMIC FORCE), and when it is local conductivity, the method is scanning tunneling microscopy (MICROSCOPY, SCANNING TUNNELING).

Concept générique

Concepts spécifiques

Synonyme(s)

  • Scanning Probe Microscopy

Qualificatif(s) autorisé(s)

Traductions

URI

http://data.loterre.fr/ark:/67375/JVR-PC1MTM67-9

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RDF/XML TURTLE JSON-LD Date de création 03/11/1999, dernière modification le 07/07/2004